Measuring national technological trajectories using 200 years of international patent data

Antonin Bergeaud,  Ruveyda Nur Gozen,  John Van Reenen

Innovation underpins sustained long-run economic growth, yet measuring technological success is challenging. This column compiles two centuries of patent data and leverages filings in multiple patent offices to document the rise and decline of technological leadership. Thie findings suggest that technological progress can be fostered through long-run investments in R&D, education, and national security.

Πηγή: Voxeu

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